基于NDIR的塑料薄膜厚度测量技术研究.doc

基于 NDIR 的塑料薄膜厚度测量技术研究摘要: 随着塑料薄膜以及以薄膜为主要辅助材料的其他产品在工业生产和人类生活中的广泛应用,薄膜的厚度越来越成为一个重要的物理性指标。因此薄膜厚度的测量一直是人们密切关注和不断研究改进的课题。本论文主要内容:第一,探讨了薄膜测厚技术的发展历史和研究现状;第二, 详细介绍了基于 NDIR 的红外测原理以及系统的总体设计方案。第三,介绍了系统中使用的硬件设备,如数据采集卡、滤光传感器、光源和用到的两个焊接电路等; 第四,阐述了所设计系统中的数据采集与处理过程和软件的运行流程及其主要的功能;最后,给出了系统调试运行的结果和数据的分析结果。本论文设计的系统可以模拟实际测厚系统的工作过程,并通过数据的分析对基于 NDIR 的塑料薄膜厚度测量技术进行了研究与验证,达到了最初的设计要求。关键词: 红外线测厚 VC++ NDIR 数据采集与处理本科毕业论文毕业设计(论文)外文摘要 Title Study on the plastic film thickness measurement technology based on NDIR Abstract : With the wide application ofplastic film and other products tothe film asthe main auxiliary materials inindustrial production and the life of human beings, the thickness ofthe film ing amore and more important indicators ofphysical. Sothe film thickness measurement has been closely and continuously improve onthe subject the people. The main contents ofthis paper: first, discusses the development history and research status ofthin film thickness measurement technology; second, introduced indetail the overall design scheme ofNDIR infrared measuring principle and system based on. Third, introduces the system used inthe hardware, devices such asdata acquisition card, filter sensor, light source and the use oftwo welding circuit; fourth, describes the operation process ofthe data acquisition and processing and software design and its main functions; finally, the system debugging results operating results and the data are given. The system designed inthis thesis can simulate the working process ofthe actual thickness measurement system, and the plastic film thickness measurement technology based onNDIR are studied and validated bythe data analysis, met the initial design requirements. Keywords :Infrared thickness VC++ NDIR data collect and process 本科毕业论文目录 1绪论................................................................................................................................. 1 课题背景及意义......................................................................................