(The Kluwer International Series in Engineering and Computer Science 19) Narinder Singh (auth.)-An Artificial Intelligence Approach to Test Generation-Springer US (1987)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1).pdf

AN ARTIFICIAL INTELLIGENCE
APPROACH TO TEST GENERATION
THE KLUWER INTERNATIONAL SERIES
IN ENGINEERING PUTER SCIENCE
KNOWLEDGE REPRESENTATION, LEARNING
AND EXPERT SYSTEMS
Consulting Editor
Tom M. Mitchell
Other books in the series:
An Artificial Intelligence Approach to VLSI Design. T. Kowalski.
ISBN 0-89838-169-X.
An Artificial Intelligence Approach to VLSI Routing. R. Joobbani.
ISBN 0-89838-205-X.
AN ARTIFICIAL INTELLIGENCE APPROACH
TO TEST GENERATION
by
Narinder Singh
Stanford University
.,~
KLUWER ACADEMIC PUBLISHERS
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Library of Congress Cataloging-in-Publication Data
Singh, Narinder, 1956-
An arti ficial intelligence approach to test generation.
(The Kluwer international series in engineering and
computer science; 19)
Bibliography: p.
I. Integrated circuits-Very large scale integration
-Testing-Data processing. 2. Expert systems (Computer
science) 3. Artificial intelligence. I. Title.
". Series.
1986 86-20892
ISBN-13: 978-1-4612-9183-1 e-ISBN:978-1-4613-1979-5
DOl: -1-4613-1979-5
Copyright © 1987 by Kluwer Academic Publishers
Softcover reprint of the hard cover 1st edition 1987
All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or
transmitted in any form or by any means, mechanical, photocopying, recording, or otherwise,
without the prior written permission of the publisher, Kluwer Academic Publishers, 101 Philip Drive,
Assinippi Park, Norwe