(The Kluwer International Series in Engineering and Computer Science 19) Narinder Singh (auth.)-An Artificial Intelligence Approach to Test Generation-Springer US (1987)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1)(1) 来自淘豆网www.taodocs.com转载请标明出处.