RF射频电路设计英文课件Lecture10 Manufacturability of a product design.ppt

RF射频电路设计英文课件Lecture10_Manufacturability of a product design ’sσValue oABPF(BandPassFilter)oSimulationwithMonteCarloAnalysisoSensitivityofPartsontheParameterofPerformanceAppendixesoFundamentalsofRandomProcessoTableoftheNormalDistributionLecture10:ManufacturabilityofaProductDesign RichardChi-HsiLi李缉熙 Cellularphone:**********(PRC) Email:******@Lecture10*RichardLi, essorfailureofproductdevelopmentis ? 1)Highyieldrate,including *Satisficationofspecifications; *Goodrepetitionoridentityofproduct; *Highreliability. 2)Lowcost,includingthecostof *Materialandparts, *Manpower, **RichardLi,eptablemanufacturability3rdstage:Production2ndstage:Pre-Production1ststage:R&DLecture10*RichardLi,2009o6σandYieldRateρ(z)Figure2DefinitionofdesigntoleranceToldesignandprocesscapability6σUSLLSLDesigntolerance=ToldesignProcesscapability=6σDefects=%Defects=%-4-3-2--1 0+1++2+3+4z=(C-m)/σImplicationsof6σDesignLecture10*RichardLi,2009Figure3Relationshipbetweenyieldratef(z)%90%80%70%60%50%40%30%20%10%0%Yieldratef(z),%DesigntoleranceToldesign,%%%%%%0%%Table1Relationshipbetweentheyieldratef(z)andthedesigntoleranceToldesignDesigntoleranceYieldrateToldesign f(z)0σ 0%1σ %2σ %3σ %4σ %5σ %6σ %7σ %Lecture10*RichardLi,2009o6σDesignforaCircuitBlockA6σcircuitdesignisadesignsuchthattheyieldrateofthiscircuitblockinmass-%when ,theexpectedyieldrateis 100%,%iscloseto100%.Lecture10*RichardLi,’6σValueρ(z)USLLSLDesigntoleranceProcesscapability=6σDefects=%Defects=%USLLSLDefects=%Defects=%Proce