autoem a software for automated acquisition and analysis of nanoparticles toni uusimaeki参考-匠人.pdf

该【autoem a software for automated acquisition and analysis of nanoparticles toni uusimaeki参考-匠人 】是由【抱琴】上传分享，文档一共【11】页，该文档可以免费在线阅读，需要了解更多关于【autoem a software for automated acquisition and analysis of nanoparticles toni uusimaeki参考-匠人 】的内容，可以使用淘豆网的站内搜索功能，选择自己适合的文档，以下文字是截取该文章内的部分文字，如需要获得完整电子版，请下载此文档到您的设备，方便您编辑和打印。:..JNanopartRes(2019)21:122https:///-019-4555-9RESEARCHPAPERAutoEM:asoftwareforautomatedacquisitionandanalysisofnanoparticlesToniUusimaeki&ThorstenWagner&Hans-GerdLipinski&RalfKaegiReceived:27November2018/Accepted:13May2019#(engineered)particlesusingelectronenergylossandenergydisper-nanomaterials(NM)hasbeenthrivingformorethanasiveX-rayspectroscopy(EELS/EDX)allowingtheex-decadeandhasdeliveredmanybeneficialapplications,tractionofelement--butalsoraisedconcernsaboutpotentialnegativeim-matedacquisitionofenergy-filteredimages(EFTEM)-isimplementedintheAutoEMsoftware,whichcanbearyprinciple,hence,callsforaregulationofcertainused,.,toderivethicknessmapsand,thus,toevalu-typesofNM,whichinconsequencerequirestheirun-atethethicknessofindividual(plate-like)--(TEM)isoneofthemostpromis-ingtechniques,,-Therefore,thegoalofthisstudywastodevelopasearchanddevelopmentofengineerednanomaterialssoftwarecode,referredtoasAutoEM,toautomatically(NM)ur-acquireTEMimages,(PSD)ofresultedinaplethoraofNMwhichtodaycanbefound(nano)--inmanytechnologicalapplicationsandconsumerprod-ratesmethodsforelementalanalysesofindividualucts(Caballero-GuzmanandNowack2016;).AlthoughNMaredesignedtoincreaseprofitabilityandsustainability,:(*)humanhealthandecosystemsraisedconcernsfromtheEawag,SwissFederalInstituteofAquaticScienceandverybeginningaboutpotentialrisksassociatedwiththeTechnology,Dübendorf,SwitzerlandincreaseduseofNM(RocoandBainbridge2005;e-mail:ralf.******@;NowackandBucheli2007;:H.<;;).InUniversityofAppliedScienceandArtsDortmund,Dortmund,aregulatoryframework,thismeansthatNMhavetobeGermanyclearlydefinedandanalyticalmethodshavetobe:..122Page2of11JNanopartRes(2019)21:122availabletounambiguouslyidentifyNMbasedontheinstrumentalsettings,isalsocapableofrecordingparti-,-bepost-processed(.,segmentationtoseparateparti-mission(EC)—forconvenience,lesfromthebackgroundandtoresolveoverlappingdefinition—statesthataparticulatematerialisaNMifparticles)toobtainanumber-(X50)ofthenumberbasedparticlesizebrightfield(BF)imagesareessentiallytwodimensionaldistribution(PSD)isbetween1and100nm(European(2D)projectionsoftheparticlesbasedonmass-Commission2011).Theimplementationofsuchadef-thicknessand/ordiffractioncontrast,andamultitudeinition,however,isonlymeaningful,ifmethodsthatofdiameterssuchasminimallateralextensionorequiv-(ECD)canbeextractedfromtheMultitudesofmethodstoobtainaPSDofpartic-recordedimages(ISO13322-12014).ThisreflectsoneulatematerialhavebeenreviewedanddescribedinofthebiggestadvantagesoftheTEMtechniqueinthescientificliterature,-likelimitationsandareaofapplication(Hassell?,forexample,theECDmaynotbeaveryuseful2008;Hassell?vandKaegi2009;;;;,).However,onlyafewmethodsfortheECdefinition,theminimumexternaldimensionsdelivernumber-basedPSDs(.,particletrackingoftheparticleshavetobeusedtoconstructtheparticleanalyses(),singleparticleinduc-(sp-ICPMS(Pacealgorithms(;;))andallofthese2012;)andnumerouspluginstoImageJmethodsdonotcoverthewholenanosizerangeas()areavailableforparticlesegmen-,,therefore,(),buttheinabil-scatteringtechniquesbasedonsingleparticleextinc-essthethirddimensionofplate-,(NP)().However,assessingdif-butthismethodisstillverytime-consumingandthusferentshapedescriptorssuchasthelengthandwidthresultsinanextremelylowparticle(andconsequentlyofrodsorthethicknessofplate-likeparticlesisverysample)throughput(;).However,moreadvancedTEMtechniques,establishedparticlesizingtechniquessuchasdy-suchasEFTEM,offeralternativewaystoassessthenamiclightscatteringorsp-ICPMS,astheparticlethicknessofnanostructures(Potapov2014)andover-ethelimitationsposedbyconventionalTEManal-conversionofrecordedsignalintensitiesintoequiv-,verycontrastingunambiguousclassificationof(plate-like),thetechniqueisstillfewhundredsofnanometerswerereportedforplate-().These,tosometheselimitations,wedevelopedasoftwareenvironmentextentdisillusioningresults,clearlyrevealthelackreferredtoasAutoEMwhich(i)allowstheautomaticessingminimalexternalrecodingandprocessingofTEMandscanningTEMdiametersinthreedimensions.(STEM)images,(ii)implementselementalanalysesofTEMallowsavisualizationofthelateralextentofindividualparticlesfortheextractionofelementallyindividualparticles(criticalforrod-likeparticles)andresolvedPSDsand(iii)includesthepossibilitytoauto-withitssuperiorresolvingpower,TEMcoverstheentirematicallyrecordEFTEMimagestoderivethicknessnanosizerange(1–100nm)and,essthethirddimensionof:..JNanopartRes(2019)21:122Page3of11122plate-,examplesSystemrequirementscoveringimaging,bothTEM-BFandSTEMdarkfield(DF),EDXspectrumimaging(SI)andEFTEMthick-?(DM)environment(MitchellandSchaffer2005)andallowsafullyautomatedacquisitionof(S)TEMimageswithanonlinepost-processingofrecordedimagesanda‘live’,theAutoEMsoftwareiscoupledwiththeNanoDefineParticleSizer(ND-PS)(WagnerPreparationofTEMgridssuitablefortheautoEM2016),writteninImageJ/Fijiopensourceplatformanalyses(;).TheND-PSisasegmentationsoftwarespeciallydevelopedforTodemonstratethepotentialoftheAutoEMsoftware,separatingoverlapping(agglomeratedoraggregated)par-TEMgrids(carbon-coatedCugrids,EMsolutions,UK)-werepreparedfrom(i)acolloidalsilicasuspensionlocalmeansfilterisusedtosmooththeimages(Wagner(particlediameter=,ERMFD304),(ii)andBehnel2015)(Ag,20mgL?1,diameter40nm,settingsoftheND-,posix),andthefollowingfourmodes:thedefaultmodefornon-monomodalgold(Au,50mgL?1,40nm,stabilizedinoverlappingparticles,,posix)suspensions,and(iii)amodeforoverlappingparticles,andellipse-fittingmodenanoclay(illite)suspension(?1,describedforoverlapping,,asin-inWicketal.(2018)).gleparticlemodeisavailable,whichusesauser-definedAllfourparticletypeswereexpectedtocarryaconvexityvalueasathresholdtorejectagglomeratesand,negativesurfacechargeunderthegivenconditions,thus,,TEMgridswerefunctionalizedusingpoly-l-TheAutoEMsoftwareusesDMtocontroltheTEM;lysine(PLL)topositivelychargetheTEMgridshence,DMhastobepresentatthemicroscopewiththe().,STEMmoderequiresDigiscanhardwaregrids(MavrocordatosandPerret1995)afterappropri-tocontroltheelectronbeam,andSTEMEDX/(1:2)andtheilliteEFTEMmoderequiresGatanimagingfilter(GIF)and(1:50)suspensionswereobtainedusingdoublydeion-(DDI)(1:50)essfullytestedwithallthreeversionsoftheAg(1:40)suspensionswereperformedin2mMDM(PConly),withthreedifferentFEImicroscopes(-TF20,T12)andwiththreedifferentJEOLmicroscopescatedfor1minusingavialtweeter(VialTweeter,(2100F,2800,and3200FSC).HielscherUltrasonicsGmbH,Germany).Forthecen-trifugationprocedure,aluminumconeswerecoveredSoftwaredevelopmentwithathinfilmofplastic(PARAFILM,Sigma-Aldrich)andTEMgridsweregentlypressedontothisWiththebasicversionoftheAutoEMsoftware,(2mL)andfilledwithSTEMDFmode,-,anyothercontrastmechanisms,.,TEMDF,phase-(ParticleLab2019).ThecentrifugationconditionscontrastorSTEMBFandSTEMhigh-angleannularwerekeptconstantforallTEMgrids(14,000×g,1h)dark-field(HAADF)canalsobeusedforimageforma-(i)EFTEM(extractionofthicknessmaps:..122Page4of11JNanopartRes(2019)21:122orcore-lossimagingforelementalinformation),(ii)(SI)allowsrecordingSTEMEDX(elementalinformation),and(iii)STEMmultipleEDXspectraofoneparticlebysequentiallyEELS(elementalinformation).WithintheworkflowofscanningtheelectronbeamovertheparticleofinterestthedataacquisitionandanalysisoftheautoEMsoft-andrecordingEDXspectrainapoint-by-,thereareseveralemptyfunctions,allowinganSIofindividualparticlesthereforeprovidesmorereli-positionofindi-,asthewholeparticleisscannedbytheThebasicversionoftheAutoEMsoftwareuserin-paredwithaBpoint^analysiswhereterface(UI)consistsofthefollowingthreetabs:camera,theelementalinformationonlyoriginatesfromaverymain,,spatiallyimagingandauto-focusingconditions;anauto-,-allowdetectingunevendistributionsofcertainelementsmonmeasurands,.,feretminorequivalentcircularwithinindividualparticles,suchascore-(ECD),,alltheEDXspectraintheSIareparallellinesconstrainingtheparticle,andtheECDisintegratedandsmoothed(SavitzkyandGolay1964)tothediameterofacirclewithanequivalentareaastheproduceoneEDXsp