固体表面物理化学-AFM-2015.11.9.pdf

原子力显微镜及衍生技术 Atomic Force Microscope (AFM) and related techniques ?原理?仪器?衍生技术 Cantilever Sample (导电,非导电) Laser Beam Atomic Force Microscopy V DC metallic wire Sample (导电) Tunneling Current Tip Scanning Tunneling Microscopy Force Calcite Reconstruction DNA Dynamics Sublimation of Anthracene Single Crystal PHB /V Spherulite 原子力显微技术 https:// /Gallery/Image -Contest -Winners/ The Cavendish Experiment (1798): determined the constant G. 微弱力的精确测量原子力显微镜的力探测 Binnig et al. , Phys. Rev. Lett. 56, 6, 930 (1986) STM –based detection 原子力显微镜的力探测 A B C D vertical displacement: (A+B) - (C+D) torsion: (A+C) -(B+D) laser -deflection piezo -resistive detection https:///library/slidepresentatio n/Public/AFM%20Probe%20ManufacturingNano 原子力显微镜探针原子力显微镜探针: Cantilever and Tip ( 微悬臂) 原子力显微镜 Cantilever Array 微悬臂阵列 biosensors 原子力显微镜探针