Accumulation of Silicon in different genotypes of oat
grains and its relationship with other eight elements
Guo-liang Zhang, Ming-shou Fan, Gang Chen, Juan Liu, Wei-dong Zhou, Guo-rong Sun
Guo-liang Zhang Gang Chen, Juan Liu, Wei-dong Zhou of Yangzhou
School of Life Science and Chemistry Engineering University
Huaiyin Institute of Technology, Huaian 223003, China Yangzhou 225009, China
Huaian 223003, China
Email: hgzgl@ Guorong Sun of Binzhou Vocational College
Ming-shou Fan of Inner Mongolia Agricultural University Binzhou 256624, China
Huhhot 010019, China
Abstract—Using environmental scanning electron microscopy relative content of the different parts in oat grains, and
and X-ray electron probe microanalysis, Si, P, Mg, K, Ca, S, Cd, analyzed its distribution rule, the interrelationship of different
Al and Pb content was studied in the cortex, aleuronic layer, near parts as well as the relationship between Si content and Al, Cd,
aleuronic layer and center of caryopsis in 22 genotypes of oat Pb, K, Ca, Mg, P, S contents.
grains. The results showed that Si content in different part of 22
genotypes of oat grains changed as cortex>aleuronic layer>near
aleuronic layer>center of caryopsis. This implied that Si Ⅱ. MATERIALS AND METHODS
predominantly deposited in the aleuronic layer for a whole oat
caryopsis. Moreover, the considera
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