信息检索方法方法.doc

外文及特种文献检索 1 .出版物( Publication )检索(1) 利用 Springer-Link 检索关于 Electronic Testing 的出版物中有关 digital circuit design 的论文(列举两篇相关文献)。课题: 利用 Springer-Link 检索关于 Electronic Testing 的出版物中有关 digital circuit design 的论文(列举两篇相关文献)。检索词(关键词): Journal of Electronic Testing digital circuit design 选择工具:数据库 Springer-Link 1、根据课题名称及所给检索词, Journal of Electronic Testing digital circuit design 2 、数据库为 Springer-Link 3、现在搜索框搜索 Journal of Electronic Testing , 在搜索结果中 Browse Volumes & Issue s 后输入 digital circuit design 。 4 、搜索结果如下,选两篇。 Journal of Electronic Testing October 2004, Volume 20, Issue 5, pp 523-531 A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis Abstract In this paper a new circuit for concurrent soft and timing error detection in CMOS ICs is presented. The circuit is based on current mode sense amplifier topologies to provide fast error detection times. After an error has been detected it can be corrected by using a retry cycle Title A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS Ics Journal ? Journal of Electronic Testing ? Volume 20, Issue 5, pp 523-531 Publisher Kluwer Academic Publishers Title A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs Journal ? Journal of Electronic Testing ? Volume 20, Issue 5, pp 523-531 Cover Date 2004-10-01 DOI